Research Article
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Published on 14 June 2023
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Zhou,J. (2023). Analog circuit fault diagnosis based on RBF. Applied and Computational Engineering,6,820-826.
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Analog circuit fault diagnosis based on RBF

Jingyi Zhou *,1,
  • 1 The University of Edinburgh, Old College, South Bridge, Edinburgh EH8 9YL

* Author to whom correspondence should be addressed.

https://doi.org/10.54254/2755-2721/6/20230967

Abstract

Analog circuit fault diagnosis is growing common using techniques based on artificial intelligence (AI). Among these, defect diagnosis based on radial basis function (RBF) has recently received attention and has demonstrated a respectable level of accuracy. This paper's goal is to demonstrate this method's thought process, methodology, and specific actions. Researchers can refer to the reference circuit diagram, experimental table, and analytic process in the publication to evaluate the efficacy of this approach. Additionally, the elements that can be changed and improved upon are highlighted, offering a path for future study.

Keywords

Analog Circuit, Fault Diagnosis, Radial Basis Function, Experiment.

[1]. C. F. Hsu, “Adaptive dynamic RBF neural controller design for a class of nonlinear systems,” Applied Soft Computing Journal, vol. 11, no. 8, pp. 4607–4613, Dec. 2011, doi: 10.1016/j.asoc.2011.08.001.

[2]. A. Zhang, C. Chen, and H. R. Karimi, “A new adaptive LSSVR with online multikernel RBF tuning to evaluate analog circuit performance,” Abstract and Applied Analysis, vol. 2013, 2013, doi: 10.1155/2013/231735.

[3]. A. Zhang, C. Chen, and H. R. Karimi, “A new adaptive LSSVR with online multikernel RBF tuning to evaluate analog circuit performance,” Abstract and Applied Analysis, vol. 2013, 2013, doi: 10.1155/2013/231735.

[4]. Y. He, Y. Tan, and Y. Sun, “Wavelet neural network approach for fault diagnosis of analogue circuits,” IEE Proceedings: Circuits, Devices and Systems, vol. 151, no. 4, pp. 379–384, Aug. 2004, doi: 10.1049/ip-cds:20040495.

Cite this article

Zhou,J. (2023). Analog circuit fault diagnosis based on RBF. Applied and Computational Engineering,6,820-826.

Data availability

The datasets used and/or analyzed during the current study will be available from the authors upon reasonable request.

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About volume

Volume title: Proceedings of the 3rd International Conference on Signal Processing and Machine Learning

Conference website: http://www.confspml.org
ISBN:978-1-915371-59-1(Print) / 978-1-915371-60-7(Online)
Conference date: 25 February 2023
Editor:Omer Burak Istanbullu
Series: Applied and Computational Engineering
Volume number: Vol.6
ISSN:2755-2721(Print) / 2755-273X(Online)

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