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Published on 1 August 2023
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Diwakar,M.;Singh,P.;Shankar,A.;E.,S.V.;Joshi,K.;Kumar,M. (2023). A Critical Review on CT Image denoising in Wavelet domain. Applied and Computational Engineering,8,31-36.
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A Critical Review on CT Image denoising in Wavelet domain

Manoj Diwakar 1, Prabhishek Singh 2, Achyut Shankar 3, Sathishkumar V. E. *,4, Kapil Joshi 5, Mohit Kumar 6
  • 1 Graphic Era Deemed to be University
  • 2 Bennett University
  • 3 University of Warwick
  • 4 Jeonbuk National University
  • 5 Uttaranchal University
  • 6 Amity University Uttar Pradesh

* Author to whom correspondence should be addressed.

https://doi.org/10.54254/2755-2721/8/20230067

Abstract

Medical images are commonly used today by medical practitioners for the purposes of diagnosis. For the purposes of diagnosis, diagnostic images are widely used today by medical professionals. In general, MRI works on soft tissues, and CT works on hard tissues. Due to device and hardware limitations, mathematical calculations, transition mechanisms in computers, there are chances of creating noise in medical images.In yhis paper, a critical review on CT image denoising has been performed in wavelet domain. In the transform domain, the process of removing noise from an image starts with the image or data being divided up into a representation in scale space. It has methods for setting thresholds, rules for shrinking, and a way to clean up noise based on wavelets, among other things.

Keywords

CT image denoising, wavelet transform, entropy, thresholding, PSNR, SSIM

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Cite this article

Diwakar,M.;Singh,P.;Shankar,A.;E.,S.V.;Joshi,K.;Kumar,M. (2023). A Critical Review on CT Image denoising in Wavelet domain. Applied and Computational Engineering,8,31-36.

Data availability

The datasets used and/or analyzed during the current study will be available from the authors upon reasonable request.

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About volume

Volume title: Proceedings of the 2023 International Conference on Software Engineering and Machine Learning

Conference website: http://www.confseml.org
ISBN:978-1-915371-63-8(Print) / 978-1-915371-64-5(Online)
Conference date: 19 April 2023
Editor:Anil Fernando, Marwan Omar
Series: Applied and Computational Engineering
Volume number: Vol.8
ISSN:2755-2721(Print) / 2755-273X(Online)

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